搜索:semiconductor material device characterization
Semiconductor material and device characterization third edition
文件大小:122MB 标注页数:779页 文件页数:797页
MD5:a8c5ff463c07debcd487ceb977d9d68b
ISBN:0471739065
出版社:IEEE Press
作者:Dieter K.Schroder
出版时间:2006